Apparatus and methods for determining an expected data age of memory cells

ABSTRACT

Methods of operating a memory including applying an intermediate read voltage to a selected access line for a read operation, adding noise to a sensing operation while applying the intermediate read voltage, determining a value indicative of a number of memory cells of a plurality of memory cells connected to the selected access line that are activated in response to applying the intermediate read voltage to the selected access line, and determining an expected data age of the plurality of memory cells in response to the value indicative of the number of memory cells of the plurality of memory cells that are activated in response to applying the intermediate read voltage to the selected access line.

RELATED APPLICATION

This patent application is related to U.S. patent application Ser. No. 16/161,230 titled “APPARATUS AND METHODS FOR DETERMINING AN EXPECTED DATA AGE OF MEMORY CELLS” filed even date herewith, which is commonly assigned.

TECHNICAL FIELD

The present disclosure relates generally to memory and, in particular, in one or more embodiments, the present disclosure relates to apparatus and methods for determining an expected data age of memory cells, which can be used in the determination of data states of those memory cells.

BACKGROUND

Memories (e.g., memory devices) are typically provided as internal, semiconductor, integrated circuit devices in computers or other electronic devices. There are many different types of memory including random-access memory (RAM), read only memory (ROM), dynamic random access memory (DRAM), synchronous dynamic random access memory (SDRAM), and flash memory.

Flash memory has developed into a popular source of non-volatile memory for a wide range of electronic applications. Flash memory typically use a one-transistor memory cell that allows for high memory densities, high reliability, and low power consumption. Changes in threshold voltage (Vt) of the memory cells, through programming (which is often referred to as writing) of charge storage structures (e.g., floating gates or charge traps) or other physical phenomena (e.g., phase change or polarization), determine the data state (e.g., data value) of each memory cell. Common uses for flash memory and other non-volatile memory include personal computers, personal digital assistants (PDAs), digital cameras, digital media players, digital recorders, games, appliances, vehicles, wireless devices, mobile telephones, and removable memory modules, and the uses for non-volatile memory continue to expand.

A NAND flash memory is a common type of flash memory device, so called for the logical form in which the basic memory cell configuration is arranged. Typically, the array of memory cells for NAND flash memory is arranged such that the control gate of each memory cell of a row of the array is connected together to form an access line, such as a word line. Columns of the array include strings (often termed NAND strings) of memory cells connected together in series between a pair of select gates, e.g., a source select transistor and a drain select transistor. Each source select transistor may be connected to a source, while each drain select transistor may be connected to a data line, such as column bit line. Variations using more than one select gate between a string of memory cells and the source, and/or between the string of memory cells and the data line, are known.

In programming memory, memory cells might be programmed as what are often termed single-level cells (SLC). SLC may use a single memory cell to represent one digit (e.g., one bit) of data. For example, in SLC, a Vt of 2.5V or higher might indicate a programmed memory cell (e.g., representing a logical 0) while a Vt of −0.5V or lower might indicate an erased memory cell (e.g., representing a logical 1). Such memory might achieve higher levels of storage capacity by including multi-level cells (MLC), triple-level cells (TLC), quad-level cells (QLC), etc., or combinations thereof in which the memory cell has multiple levels that enable more digits of data to be stored in each memory cell. For example, MLC might be configured to store two digits of data per memory cell represented by four Vt ranges, TLC might be configured to store three digits of data per memory cell represented by eight Vt ranges, QLC might be configured to store four digits of data per memory cell represented by sixteen Vt ranges, and so on.

Sensing (e.g., reading or verifying) a data state of a memory cell often involves detecting whether the memory cell is activated in response to a particular voltage applied to its control gate, such as by detecting whether a data line connected to the memory cell experiences a change in voltage level caused by current flow through the memory cell. Memory relying on levels of stored charge to define different Vt ranges are often subject to charge loss over time, resulting in shifting and spreading of the Vt ranges. This can lead to an inaccurate determination of the data state of a sensed memory cell due to the change of its Vt over time.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a simplified block diagram of a memory in communication with a processor as part of an electronic system, according to an embodiment.

FIGS. 2A-2C are schematics of portions of an array of memory cells as could be used in a memory of the type described with reference to FIG. 1.

FIG. 3 is a conceptual depiction of threshold voltage distributions of a plurality of memory cells.

FIGS. 4A-4B are conceptual depictions of threshold voltage distributions of a plurality of memory cells in accordance with an embodiment.

FIGS. 5A-5D are graphs showing hypothetical assumed relationships between data age of a group of memory cells and a number of memory cells activated in response to particular read voltages in accordance with embodiments.

FIG. 6 is a block schematic depicting a connection of a data line to a sensing device and page buffer for use with various embodiments.

FIGS. 7A-7F are graphs showing example waveforms for use in accordance with embodiments.

FIG. 8 depicts a timing diagram for a method of operating a memory in accordance with an embodiment.

FIG. 9 depicts a timing diagram for a method of operating a memory in accordance with an embodiment.

FIG. 10 is a flowchart of a method of operating a memory in accordance with an embodiment.

FIG. 11 is a flowchart of a method of operating a memory in accordance with another embodiment.

FIG. 12 is a flowchart of a method of operating a memory in accordance with a further embodiment.

DETAILED DESCRIPTION

In the following detailed description, reference is made to the accompanying drawings that form a part hereof, and in which is shown, by way of illustration, specific embodiments. In the drawings, like reference numerals describe substantially similar components throughout the several views. Other embodiments may be utilized and structural, logical and electrical changes may be made without departing from the scope of the present disclosure. The following detailed description is, therefore, not to be taken in a limiting sense.

The term “semiconductor” used herein can refer to, for example, a layer of material, a wafer, or a substrate, and includes any base semiconductor structure. “Semiconductor” is to be understood as including silicon-on-sapphire (SOS) technology, silicon-on-insulator (SOI) technology, thin film transistor (TFT) technology, doped and undoped semiconductors, epitaxial layers of a silicon supported by a base semiconductor structure, as well as other semiconductor structures well known to one skilled in the art. Furthermore, when reference is made to a semiconductor in the following description, previous process steps may have been utilized to form regions/junctions in the base semiconductor structure, and the term semiconductor can include the underlying layers containing such regions/junctions. The term conductive as used herein, as well as its various related forms, e.g., conduct, conductively, conducting, conduction, conductivity, etc., refers to electrically conductive unless otherwise apparent from the context. Similarly, the term connecting as used herein, as well as its various related forms, e.g., connect, connected, connection, etc., refers to electrically connecting unless otherwise apparent from the context.

FIG. 1 is a simplified block diagram of a first apparatus, in the form of a memory (e.g., memory device) 100, in communication with a second apparatus, in the form of a processor 130, as part of a third apparatus, in the form of an electronic system, according to an embodiment. Some examples of electronic systems include personal computers, personal digital assistants (PDAs), digital cameras, digital media players, digital recorders, games, appliances, vehicles, wireless devices, mobile telephones and the like. The processor 130, e.g., a controller external to the memory device 100, may be a memory controller or other external host device.

Memory device 100 includes an array of memory cells 104 logically arranged in rows and columns. Memory cells of a logical row are typically connected to the same access line (commonly referred to as a word line) while memory cells of a logical column are typically selectively connected to the same data line (commonly referred to as a bit line). A single access line may be associated with more than one logical row of memory cells and a single data line may be associated with more than one logical column. Memory cells (not shown in FIG. 1) of at least a portion of array of memory cells 104 are capable of being programmed to one of at least two target data states.

A row decode circuitry 108 and a column decode circuitry 110 are provided to decode address signals. Address signals are received and decoded to access the array of memory cells 104. Memory device 100 also includes input/output (I/O) control circuitry 112 to manage input of commands, addresses and data to the memory device 100 as well as output of data and status information from the memory device 100. An address register 114 is in communication with I/O control circuitry 112 and row decode circuitry 108 and column decode circuitry 110 to latch the address signals prior to decoding. A command register 124 is in communication with I/O control circuitry 112 and control logic 116 to latch incoming commands. A trim register 128 may be in communication with the control logic 116. The trim register 128 might represent a volatile memory, latches or other storage location, volatile or non-volatile. For some embodiments, the trim register 128 might represent a portion of the array of memory cells 104. The trim register 128 might store information relating to the determination of an expected data age of memory cells, and/or the determination of read voltages, in accordance with embodiments. The control logic 116 might be configured to perform methods of operating a memory in accordance with embodiments.

A controller (e.g., the control logic 116 internal to the memory device 100) controls access to the array of memory cells 104 in response to the commands and generates status information for the external processor 130, i.e., control logic 116 is configured to perform access operations (e.g., read operations, programming operations and/or erase operations) on the array of memory cells 104. The control logic 116 is in communication with row decode circuitry 108 and column decode circuitry 110 to control the row decode circuitry 108 and column decode circuitry 110 in response to the addresses.

Control logic 116 is also in communication with a cache register 118. Cache register 118 latches data, either incoming or outgoing, as directed by control logic 116 to temporarily store data while the array of memory cells 104 is busy writing or reading, respectively, other data. During a programming operation (e.g., write operation), data may be passed from the cache register 118 to the data register 120 for transfer to the array of memory cells 104; then new data may be latched in the cache register 118 from the I/O control circuitry 112. During a read operation, data may be passed from the cache register 118 to the I/O control circuitry 112 for output to the external processor 130; then new data may be passed from the data register 120 to the cache register 118. The cache register 118 and/or the data register 120 may form (e.g., may form a portion of) a page buffer of the memory device 100. A page buffer may further include sensing devices (not shown in FIG. 1) to sense a data state of a memory cell of the array of memory cells 104, e.g., by sensing a state of a data line connected to that memory cell. A status register 122 may be in communication with I/O control circuitry 112 and control logic 116 to latch the status information for output to the processor 130.

Memory device 100 receives control signals at control logic 116 from processor 130 over a control link 132. The control signals might include a chip enable CE#, a command latch enable CLE, an address latch enable ALE, a write enable WE#, a read enable RE#, and a write protect WP#. Additional or alternative control signals (not shown) may be further received over control link 132 depending upon the nature of the memory device 100. Memory device 100 receives command signals (which represent commands), address signals (which represent addresses), and data signals (which represent data) from processor 130 over a multiplexed input/output (I/O) bus 134 and outputs data to processor 130 over I/O bus 134.

For example, the commands may be received over input/output (I/O) pins [7:0] of I/O bus 134 at I/O control circuitry 112 and may then be written into command register 124. The addresses may be received over input/output (I/O) pins [7:0] of I/O bus 134 at I/O control circuitry 112 and may then be written into address register 114. The data may be received over input/output (I/O) pins [7:0] for an 8-bit device or input/output (I/O) pins [15:0] for a 16-bit device at I/O control circuitry 112 and then may be written into cache register 118. The data may be subsequently written into data register 120 for programming the array of memory cells 104. For another embodiment, cache register 118 may be omitted, and the data may be written directly into data register 120. Data may also be output over input/output (I/O) pins [7:0] for an 8-bit device or input/output (I/O) pins [15:0] for a 16-bit device.

It will be appreciated by those skilled in the art that additional circuitry and signals can be provided, and that the memory device 100 of FIG. 1 has been simplified. It should be recognized that the functionality of the various block components described with reference to FIG. 1 may not necessarily be segregated to distinct components or component portions of an integrated circuit device. For example, a single component or component portion of an integrated circuit device could be adapted to perform the functionality of more than one block component of FIG. 1. Alternatively, one or more components or component portions of an integrated circuit device could be combined to perform the functionality of a single block component of FIG. 1.

Additionally, while specific I/O pins are described in accordance with popular conventions for receipt and output of the various signals, it is noted that other combinations or numbers of I/O pins (or other I/O node structures) may be used in the various embodiments.

FIG. 2A is a schematic of a portion of an array of memory cells 200A, such as a NAND memory array, as could be used in a memory of the type described with reference to FIG. 1, e.g., as a portion of array of memory cells 104. Memory array 200A includes access lines, such as word lines 202 ₀ to 202 _(N), and data lines, such as bit lines 204 ₀ to 204 _(M). The word lines 202 may be connected to global access lines (e.g., global word lines), not shown in FIG. 2A, in a many-to-one relationship. For some embodiments, memory array 200A may be formed over a semiconductor that, for example, may be conductively doped to have a conductivity type, such as a p-type conductivity, e.g., to form a p-well, or an n-type conductivity, e.g., to form an n-well.

Memory array 200A might be arranged in rows (each corresponding to a word line 202) and columns (each corresponding to a bit line 204). Each column may include a string of series-connected memory cells (e.g., non-volatile memory cells), such as one of NAND strings 206 ₀ to 206 _(M). Each NAND string 206 might be connected (e.g., selectively connected) to a common source (SRC) 216 and might include memory cells 208 ₀ to 208 _(N). The memory cells 208 may represent non-volatile memory cells for storage of data. The memory cells 208 of each NAND string 206 might be connected in series between a select gate 210 (e.g., a field-effect transistor), such as one of the select gates 210 ₀ to 210 _(M) (e.g., that may be source select transistors, commonly referred to as select gate source), and a select gate 212 (e.g., a field-effect transistor), such as one of the select gates 212 ₀ to 212 _(M) (e.g., that may be drain select transistors, commonly referred to as select gate drain). Select gates 210 ₀ to 210 _(M) might be commonly connected to a select line 214, such as a source select line (SGS), and select gates 212 ₀ to 212 _(M) might be commonly connected to a select line 215, such as a drain select line (SGD). Although depicted as traditional field-effect transistors, the select gates 210 and 212 may utilize a structure similar to (e.g., the same as) the memory cells 208. The select gates 210 and 212 might represent a plurality of select gates connected in series, with each select gate in series configured to receive a same or independent control signal.

A source of each select gate 210 might be connected to common source 216. The drain of each select gate 210 might be connected to a memory cell 208 ₀ of the corresponding NAND string 206. For example, the drain of select gate 210 ₀ might be connected to memory cell 208 ₀ of the corresponding NAND string 206 ₀. Therefore, each select gate 210 might be configured to selectively connect a corresponding NAND string 206 to common source 216. A control gate of each select gate 210 might be connected to select line 214.

The drain of each select gate 212 might be connected to the bit line 204 for the corresponding NAND string 206. For example, the drain of select gate 212 ₀ might be connected to the bit line 204 ₀ for the corresponding NAND string 206 ₀. The source of each select gate 212 might be connected to a memory cell 208 _(N) of the corresponding NAND string 206. For example, the source of select gate 212 ₀ might be connected to memory cell 208 _(N) of the corresponding NAND string 206 ₀. Therefore, each select gate 212 might be configured to selectively connect a corresponding NAND string 206 to the corresponding bit line 204. A control gate of each select gate 212 might be connected to select line 215.

The memory array in FIG. 2A might be a quasi-two-dimensional memory array and might have a generally planar structure, e.g., where the common source 216, NAND strings 206 and bit lines 204 extend in substantially parallel planes. Alternatively, the memory array in FIG. 2A might be a three-dimensional memory array, e.g., where NAND strings 206 may extend substantially perpendicular to a plane containing the common source 216 and to a plane containing the bit lines 204 that may be substantially parallel to the plane containing the common source 216.

Typical construction of memory cells 208 includes a data-storage structure 234 (e.g., a floating gate, charge trap, or other structure configured to store charge) that can determine a data state of the memory cell (e.g., through changes in threshold voltage), and a control gate 236, as shown in FIG. 2A. The data-storage structure 234 may include both conductive and dielectric structures while the control gate 236 is generally formed of one or more conductive materials. In some cases, memory cells 208 may further have a defined source/drain (e.g., source) 230 and a defined source/drain (e.g., drain) 232. Memory cells 208 have their control gates 236 connected to (and in some cases form) a word line 202.

A column of the memory cells 208 may be a NAND string 206 or a plurality of NAND strings 206 selectively connected to a given bit line 204. A row of the memory cells 208 may be memory cells 208 commonly connected to a given word line 202. A row of memory cells 208 can, but need not, include all memory cells 208 commonly connected to a given word line 202. Rows of memory cells 208 may often be divided into one or more groups of physical pages of memory cells 208, and physical pages of memory cells 208 often include every other memory cell 208 commonly connected to a given word line 202. For example, memory cells 208 commonly connected to word line 202 _(N) and selectively connected to even bit lines 204 (e.g., bit lines 204 ₀, 204 ₂, 204 ₄, etc.) may be one physical page of memory cells 208 (e.g., even memory cells) while memory cells 208 commonly connected to word line 202 _(N) and selectively connected to odd bit lines 204 (e.g., bit lines 204 ₁, 204 ₃, 204 ₅, etc.) may be another physical page of memory cells 208 (e.g., odd memory cells). Although bit lines 204 ₃-204 ₅ are not explicitly depicted in FIG. 2A, it is apparent from the figure that the bit lines 204 of the array of memory cells 200A may be numbered consecutively from bit line 204 ₀ to bit line 204 _(M). Other groupings of memory cells 208 commonly connected to a given word line 202 may also define a physical page of memory cells 208. For certain memory devices, all memory cells commonly connected to a given word line might be deemed a physical page of memory cells. The portion of a physical page of memory cells (which, in some embodiments, could still be the entire row) that is read during a single read operation or programmed during a single programming operation (e.g., an upper or lower page of memory cells) might be deemed a logical page of memory cells. A block of memory cells may include those memory cells that are configured to be erased together, such as all memory cells connected to word lines 202 ₀-202 _(N) (e.g., all NAND strings 206 sharing common word lines 202). Unless expressly distinguished, a reference to a page of memory cells herein refers to the memory cells of a logical page of memory cells.

Although the example of FIG. 2A is discussed in conjunction with NAND flash, the embodiments and concepts described herein are not limited to a particular array architecture or structure, and can include other structures (e.g., SONOS or other data storage structure configured to store charge) and other architectures (e.g., AND arrays, NOR arrays, etc.).

FIG. 2B is another schematic of a portion of an array of memory cells 200B as could be used in a memory of the type described with reference to FIG. 1, e.g., as a portion of array of memory cells 104. Like numbered elements in FIG. 2B correspond to the description as provided with respect to FIG. 2A. FIG. 2B provides additional detail of one example of a three-dimensional NAND memory array structure. The three-dimensional NAND memory array 200B may incorporate vertical structures which may include semiconductor pillars where a portion of a pillar may act as a channel region of the memory cells of NAND strings 206. The NAND strings 206 may be each selectively connected to a bit line 204 ₀-204 _(M) by a select transistor 212 (e.g., that may be drain select transistors, commonly referred to as select gate drain) and to a common source 216 by a select transistor 210 (e.g., that may be source select transistors, commonly referred to as select gate source). Multiple NAND strings 206 might be selectively connected to the same bit line 204. Subsets of NAND strings 206 can be connected to their respective bit lines 204 by biasing the select lines 215 ₀-215 _(K) to selectively activate particular select transistors 212 each between a NAND string 206 and a bit line 204. The select transistors 210 can be activated by biasing the select line 214. Each word line 202 may be connected to multiple rows of memory cells of the memory array 200B. Rows of memory cells that are commonly connected to each other by a particular word line 202 may collectively be referred to as tiers.

FIG. 2C is a further schematic of a portion of an array of memory cells 200C as could be used in a memory of the type described with reference to FIG. 1, e.g., as a portion of array of memory cells 104. Like numbered elements in FIG. 2C correspond to the description as provided with respect to FIG. 2A. Array of memory cells 200C may include strings of series-connected memory cells (e.g., NAND strings) 206, access (e.g., word) lines 202, data (e.g., bit) lines 204, select lines 214 (e.g., source select lines), select lines 215 (e.g., drain select lines) and source 216 as depicted in FIG. 2A. A portion of the array of memory cells 200A may be a portion of the array of memory cells 200C, for example. FIG. 2C depicts groupings of NAND strings 206 into blocks of memory cells 250. Blocks of memory cells 250 may be groupings of memory cells 208 that may be erased together in a single erase operation, sometimes referred to as erase blocks. Each block of memory cells 250 might represent those NAND strings 206 commonly associated with a single select line 215, e.g., select line 215 ₀. The source 216 for the block of memory cells 250 ₀ might be a same source as the source 216 for the block of memory cells 250 _(L). For example, each block of memory cells 250 ₀-250 _(L) might be commonly selectively connected to the source 216. Access lines 202 and select lines 214 and 215 of one block of memory cells 250 may have no direct connection to access lines 202 and select lines 214 and 215, respectively, of any other block of memory cells of the blocks of memory cells 250 ₀-250 _(L).

The data lines 204 ₀-204 _(M) may be connected (e.g., selectively connected) to a buffer portion 240, which might be a portion of a page buffer of the memory. The buffer portion 240 might correspond to a memory plane (e.g., the set of blocks of memory cells 250 ₀-250 _(L)). The buffer portion 240 might include sensing devices (not shown) for sensing data values indicated on respective data lines 204, and corresponding registers (not shown) for storage of the sensed data values from its corresponding memory plane.

FIG. 3 is a conceptual depiction of threshold voltage ranges of a plurality of memory cells. FIG. 3 illustrates an example of threshold voltage ranges and their distributions for a population of a sixteen-level memory cells, often referred to as QLC memory cells. For example, such a memory cell might be programmed to a threshold voltage (Vt) that falls within one of sixteen different threshold voltage ranges 330 ₀-330 ₁₅, each being used to represent a data state corresponding to a bit pattern of four bits. The threshold voltage range 330 ₀ typically has a greater width than the remaining threshold voltage ranges 330 ₁-330 ₁₅ as memory cells are generally all placed in the data state corresponding to the threshold voltage range 330 ₀, then subsets of those memory cells are subsequently programmed to have threshold voltages in one of the threshold voltage ranges 330 ₁-330 ₁₅. As programming operations are generally more incrementally controlled than erase operations, these threshold voltage ranges 330 ₁-330 ₁₅ may tend to have tighter distributions.

The threshold voltage ranges 330 ₀, 330 ₁, 330 ₂, 330 ₃, 330 ₄, 330 ₅, 330 ₆, 330 ₇, 330 ₈, 330 ₉, 330 ₁₀, 330 ₁₁, 330 ₁₂, 330 ₁₃, 330 ₁₄ and 330 ₁₅ might each represent a respective data state, e.g., L0, L1, L2, L3, L4, L5, L6, L7, L8, L9, L10, L11, L12, L13, L14 and L15, respectively. As an example, if the threshold voltage of a memory cell is within the first of the sixteen threshold voltage ranges 330 ₀, the memory cell in this case may be storing a data state L0 having a data value of logical ‘1111’ and is typically referred to as the erased state of the memory cell. If the threshold voltage is within the second of the sixteen threshold voltage ranges 330 ₁, the memory cell in this case may be storing a data state L1 having a data value of logical ‘0111’. If the threshold voltage is within the third of the sixteen threshold voltage ranges 330 ₂, the memory cell in this case may be storing a data state L2 having a data value of logical ‘0011’, and so on. Table 1 provides one possible correspondence between the data states and their corresponding logical data values. Other assignments of data states to logical data values are known. Memory cells remaining in the lowest data state (e.g., the erased state or L0 data state), as used herein, will be deemed to be programmed to the lowest data state. The information of Table 1 might be contained within the trim register 128, for example.

TABLE 1 Logical Data Data State Value  L0 1111  L1 0111  L2 0011  L3 1011  L4 1001  L5 0001  L6 0101  L7 1101  L8 1100  L9 0100 L10 0000 L11 1000 L12 1010 L13 0010 L14 0110 L15 1110

As memory cells are reduced in size, their associated data storage structures generally become smaller. In addition, as more levels of data states are stored to memory cells, differentiation between data states may become more difficult.

Threshold voltages of memory cells may shift due to such phenomena as quick charge loss (QCL). QCL is a de-trapping of electrons near a gate dielectric interface out to the channel region of the memory cell, and can cause a Vt shift shortly after a programming pulse. When a memory cell passes the verify operation, the programmed threshold voltage may appear to be higher due to the trapped charge in the gate dielectric. When the memory cell is read after the program operation has been completed, the memory cell may have a Vt that is lower than the Vt obtained during the program verify operation due to the charge in the gate dielectric leaking out to the channel region.

Threshold voltages of memory cells may further shift due to cumulative charge loss over the age of their programmed data, e.g., a period of time between programming the data and reading the data, referred to herein as data age. Such charge loss can become more pronounced as the data storage structures become smaller. This can make accurate determination of data states more difficult as the threshold voltage of a memory cell may shift enough to place it in the threshold voltage range of a target data state that is two or more levels lower than its original target data state. Various embodiments provide apparatus and methods that may facilitate a mitigation of these concerns.

Charge loss resulting from data age might be predictable, and may generally exhibit an exponential decay function. As a result, expected Vt ranges for memory cells having a known data age might be determinable. Various embodiments seek to determine an expected data age of memory cells, which can thus provide guidance with regard to read voltages that should be used when determining the intended data states of those memory cells.

FIGS. 4A-4B are conceptual depictions of threshold voltage distributions of a plurality of memory cells in accordance with an embodiment. The threshold voltage ranges 430 ₀-430 ₁₅ of FIG. 4A might correspond to the threshold voltage ranges 330 ₀-330 ₁₅ of FIG. 3 at a first data age, while the threshold voltage ranges 430 ₀-430 ₁₅ of FIG. 4B might correspond to the threshold voltage ranges 330 ₀-330 ₁₅ of FIG. 3 at a second data age, higher than the first data age.

In determining the data states of the memory cells of the various distributions of FIG. 4A, read voltages 432 ₀-432 ₁₄ might be used. For example, where the read voltages 432 are applied in increasing order, memory cells first activating in response to the read voltage 432 ₀ might be determined to have the data state corresponding to the threshold voltage range 430 ₀, memory cells first activating in response to the read voltage 432 ₁ might be determined to have the data state corresponding to the threshold voltage range 430 ₁, memory cells first activating in response to the read voltage 432 ₂ might be determined to have the data state corresponding to the threshold voltage range 430 ₂, and so on. Memory cells that do not activate in response to any of the read voltages 432 ₀-432 ₁₄ might be deemed to have the data state corresponding to the threshold voltage range 430 ₁₅. The voltage range between the highest read voltage and the lowest read voltage of the read operation might represent a read window 434. Immediately subsequent to programming the memory cells, the read window 434, e.g., an initial read window, might be approximately 6V, and range from −1V to 5V, for example.

In determining the data states of the memory cells of the various distributions of FIG. 4B, read voltages 432′₀-432′₁₄ might be used. For example, where the read voltages 432′ are applied in increasing order, memory cells first activating in response to the read voltage 432′₀ might be determined to have the data state corresponding to the threshold voltage range 430 ₀, memory cells first activating in response to the read voltage 432′₁ might be determined to have the data state corresponding to the threshold voltage range 430 ₁, memory cells first activating in response to the read voltage 432′₂ might be determined to have the data state corresponding to the threshold voltage range 430 ₂, and so on. Memory cells that do not activate in response to any of the read voltages 432′₀-432′₁₄ might be deemed to have the data state corresponding to the threshold voltage range 430 ₁₅. In the example of FIG. 4B, threshold voltage distributions for the various data states are depicted as overlapping due to spreading that often occurs as a result of charge loss. While some memory cells that were originally programmed to have a particular data state, e.g., the data state corresponding to the threshold voltage range 430 ₂, might be erroneously deemed to have the next lower or next higher data state, e.g., the data states corresponding to the threshold voltage ranges 430 ₁ and 430 ₃, respectively, error correction might be used to correct these errors as is well understood in the relevant art.

The read window 434′ of FIG. 4B, as a result of the shifting of the threshold voltage ranges 430, might be smaller than the read window 434 of FIG. 4A. For example, after five time decades, the read window 434′ might be approximately 5V, and range from −1V to 4V, for example. As a result, the set of read voltages 432′₀-432′₁₄ of FIG. 4B would generally need to be different than the set of read voltages 432 ₀-432 ₁₄ of FIG. 4A in order to more accurately determine the intended data states of the memory cells. Time decades are defined such that X time decades equals 10^(X) seconds, e.g., 0 time decades equals 1 second, 1 time decade equals 10 seconds, 2 time decades equals 100 seconds, etc.

Desired read voltages as a function of data age (e.g., the slope of a line, the constants of a polynomial or other characterization) might be determined empirically, based on knowledge of the structure and materials of the memory cells, or directly through experimentation. For example, various data states (e.g., a pseudo-random distribution) might be programmed to a group of memory cells, and the resulting threshold voltages can be determined at different data ages. A composite function could be fitted from the individual responses of these memory cells. A function could be determined for a memory array as a whole, or individual functions might be determined on some sub-portion of the memory array, e.g., by block of memory cells.

It is proposed that a number memory cells of the programmed memory cells that activate in response to a given read voltage can be used to indicate an expected data age of the programmed memory cells. Generally, a page of memory cells will be programmed with a distribution of data values that approaches a random distribution, often by design. As such, it might be assumed that there would be an equal number of memory cells programmed to each of the possible target data states. If an intermediate read voltage, i.e., a read voltage having a voltage level between the highest voltage level and the lowest voltage level of the read window at the time of programming, is applied to an access line connected to a group of memory cells (e.g., a page of memory cells), the number of memory cells activating in response to that intermediate read voltage might be determined. Consider the example of the intermediate read voltage 436 being applied to a group of memory cells having the data age of FIG. 4A. The number of memory cells activated in response to the intermediate read voltage 436 might be expected to be 13/16, or approximately 81%, of the group of memory cells, i.e., the memory cells of the distributions of FIG. 4A for each of the sixteen target data states. However, if that same intermediate read voltage 436 is applied to that group of memory cells having the data age of FIG. 4B, the number of memory cells activated in response to that intermediate read voltage 436 might be expected to be in excess of 14/16, or in excess of approximately 88%, of the group of memory cells. While discussed in this example as a fraction or percentage of the group of memory cells, any other representation of the number of activated memory cells might be used, such as an integer value. Accordingly, this number of activated memory cells for an intermediate read voltage of a particular voltage level might be used to determine an expected data age of the group of memory cells. Note that although the intermediate read voltage 436 was depicted as being a voltage level other than any of the read voltages 432, the intermediate read voltage 436 could alternatively have a voltage level equal to the voltage level of one of the read voltages 432. In addition, the intermediate read voltage 436 might have a voltage level that is in the upper half of the read window 434, e.g., an initial read window. The intermediate read voltage 436 might have a voltage level that is in the upper quarter of the read window 434, e.g., an initial read window. For some embodiments, the intermediate read voltage 436 might have a voltage level within a range of a lowest voltage level of the initial read window plus 0.70-0.95 times the width of the initial read window. For example, where the initial read window ranges from −1V to 5V, the intermediate read voltage 436 might have a voltage level within the range of −1V+0.70*(5V−(−1V)) to −1V+0.95*(5V−(−1V)), or 3.2V to 4.7V.

FIGS. 5A-5D are graphs showing hypothetical relationships between data age of a group of memory cells and a number of memory cells activated in response to particular read voltages in accordance with embodiments. The relationship between data age and the number of memory cells activated in response to a particular intermediate read voltage (e.g., the slope of a line, the constants of a polynomial or other characterization) might be determined empirically, based on knowledge of the structure and materials of the memory cells, or directly through experimentation. For example, various data states (e.g., a pseudo-random distribution) might be programmed to a group of memory cells, e.g., during factory testing or periodically or intermittently during use, and the number of memory cells activated in response to a particular intermediate read voltage can be determined at different data ages. The examples of FIGS. 5A-5D were generally developed through simulation of the reading of a group of memory cells containing 8 KB of data, and assuming a pass voltage of 5V, a QLC sigma of 60 mV, a charge loss effect for memory cells programmed to the L15 data state of 0.75 mV±20 mV/time decade (e.g., linear with Vt), and a read error sigma of 20 mV. FIG. 5A assumed an intermediate read voltage of 3.25V, FIG. 5B assumed an intermediate read voltage of 3.75V, FIG. 5C assumed an intermediate read voltage of 4.5V, and FIG. 5D assumed an intermediate read voltage of 4.625V. From the raw data, either empirical or direct, a function, at a particular intermediate read voltage, could be determined for a memory array as a whole, or individual functions might be determined on some sub-portion of the memory array, e.g., by page or block of memory cells. Alternatively, one or more tables might be developed from the raw data, either for the memory array as a whole, or for individual sub-portions of the memory array, e.g., by page or block of memory cells.

Table 2 is an example of a table (e.g., a lookup table) that might be used to determine an expected data age from a number of memory cells activating in response to a particular intermediate read voltage, such as depicted in the examples of FIGS. 5A-5D. The information of Table 2 might be contained within the trim register 128, for example.

TABLE 2 Activated Memory Expected Data Age Cells (%) (Time Decades) 87.5 0 88.8 1 91.5 2 93.0 3 93.7 4 94.1 5

Table 3 is another example of a table that might be used to determine an expected data age from a quantity (e.g., an integer value) of memory cells activating in response to a particular intermediate read voltage, such as depicted in the examples of FIGS. 5A-5D. The information of Table 3 might be contained within the trim register 128, for example.

TABLE 3 Activated Memory Expected Data Age Cells (Bytes) (Time Decades) 7170 0 7275 1 7495 2 7620 3 7675 4 7710 5

Table 4 is an example of a table structure that might be used to determine desired read voltages in response to determining an expected data age of the group memory cells. The information of Table 4 might be contained within the trim register 128, for example.

TABLE 4 Expected Data Age RD₀ RD₁ RD₂ • • • RD₁₃ RD₁₄ (Time Decades) (432₀) (432₁) (432₂) • • • (432₁₃) (432₁₄) 0 RD₀₋₀ RD₁₋₀ RD₂₋₀ • • • RD₁₃₋₀ RD₁₄₋₀ 1 RD₀₋₁ RD₁₋₁ RD₂₋₁ • • • RD₁₃₋₁ RD₁₄₋₁ 2 RD₀₋₂ RD₁₋₂ RD₂₋₂ • • • RD₁₃₋₂ RD₁₄₋₂ 3 RD₀₋₃ RD₁₋₃ RD₂₋₃ • • • RD₁₃₋₃ RD₁₄₋₃ 4 RD₀₋₄ RD₁₋₄ RD₂₋₄ • • • RD₁₃₋₄ RD₁₄₋₄ 5 RD₀₋₅ RD₁₋₅ RD₂₋₅ • • • RD₁₃₋₅ RD₁₄₋₅

Consider Table 4 in reference to the example of FIG. 4A. RD₀₋₀ might correspond to the read voltage 432 ₀ to be used at an expected data age of 0 time decades, RD₀₋₁ might correspond to the read voltage 432 ₀ to be used at an expected data age of 1 time decade, RD₀₋₂ might correspond to the read voltage 432 ₀ to be used at an expected data age of 2 time decades, and so on. Similar correspondences can be made for the remaining read voltages 432 ₁-432 ₁₄. For some embodiments, the values for the read voltage 432 ₀ might remain constant for each time decade. In general, the values for the read voltages 430 ₁-432 ₁₄ might be expected to decrease with increasing time decades. While the examples of Tables 2-4 depict only integer values of time decades, intermediate values might also be utilized, such as depicted in FIGS. 5A-5D.

Table 5 is an example of a table structure that might be used to determine desired read voltages in response to the number of memory cells activating in response to applying the intermediate read voltage without first determining an expected data age of the group memory cells. The information of Table 5 might be contained within the trim register 128, for example.

TABLE 5 Activated Memory RD₀ RD₁ RD₂ • • • RD₁₃ RD₁₄ Cells (%) (432₀) (432₁) (432₂) • • • (432₁₃) (432₁₄) 87.5 RD₀₋₁ RD₁₋₁ RD₂₋₁ • • • RD₁₃₋₁ RD₁₄₋₁ 88.8 RD₀₋₂ RD₁₋₂ RD₂₋₂ • • • RD₁₃₋₂ RD₁₄₋₂ 91.5 RD₀₋₃ RD₁₋₃ RD₂₋₃ • • • RD₁₃₋₃ RD₁₄₋₃ 93.0 RD₀₋₄ RD₁₋₄ RD₂₋₄ • • • RD₁₃₋₄ RD₁₄₋₄ 93.7 RD₀₋₅ RD₁₋₅ RD₂₋₅ • • • RD₁₃₋₅ RD₁₄₋₅ 94.1 RD₀₋₆ RD₁₋₆ RD₂₋₆ • • • RD₁₃₋₆ RD₁₄₋₆

In Table 5, RD₀₋₁ might correspond to the read voltage 432 ₀ to be used when the value indicative of the number of activated memory cells has its first value (e.g., 87.5%), RD₀₋₂ might correspond to the read voltage 432 ₀ to be used when the value indicative of the number of activated memory cells has its second value (e.g., 88.8%), RD₀₋₃ might correspond to the read voltage 432 ₀ to be used when the value indicative of the number of activated memory cells has its third value (e.g., 91.5%), and so on. Similar correspondences can be made for the remaining read voltages 432 ₁-432 ₁₄. For some embodiments, the values for the read voltage 432 ₀ might remain constant for each value indicative of the number of activated memory cells. In general, the values for the read voltages 430 ₁-432 ₁₄ might be expected to decrease with increasing time decades.

In using a lookup table, embodiments may seek to interpolate between values when no exact match exists. Alternatively, embodiments might select the value of the table that is closest to the determined value, e.g., the determined value indicative of a number of activated memory cells or the determined expected data age.

FIG. 6 is a block schematic depicting a connection of a data line to a page buffer and sensing device for use with various embodiments. In FIG. 6, a NAND string 206 is selectively connected to a data line 204 through a select gate 212, and to a source 216 through a select gate 210. The NAND string 206 might have the same structure as described with reference to FIG. 2A, having N+1 memory cells 208 ₀-208 _(N). In reading the data state of one of the memory cells 208 ₀-208 _(N), the select gates 210 and 212 might be activated, a read voltage might be applied to the access line (e.g., selected access line) connected to a memory cell selected for the read operation, e.g., a target memory cell, and a pass voltage might be applied to the access lines (e.g., unselected access lines) connected to remaining memory cells (e.g., each remaining memory cell) of the NAND string 206. For example, if the memory cell 208 ₁ is selected for the read operation, it might receive the read voltage at its control gate, where that read voltage is configured to activate the memory cell 208 ₁ if its data state corresponds to a threshold voltage that is lower than or equal to the read voltage, and to deactivate the memory cell 208 ₁ if its data state corresponds to a threshold voltage that is higher than the read voltage. Each remaining memory cell 208 (e.g., memory cells 208 ₀ and 208 ₂-208 _(N)) might receive a pass voltage at their control gates, where that pass voltage is configured to activate each of the remaining memory cells 208 regardless of their data state.

The state of the data line 204 might indicate whether the target memory cell 208 ₁ is in a state of activation or deactivation because current flow between the data line 204 and the source 216 might be enabled or inhibited, respectively. This property can then be sensed by a sensing device 640 connected to (e.g., selectively connected to) the data line 204, such as through a measurement of current flow or a resulting voltage level, or a comparison of current flow or resulting voltage level to some threshold value, e.g., using a differential amplifier or the like. The output of the sensing device 640 might be used to set one or more registers of a page buffer 240. For example, a first register 644 might be a one-digit (e.g., one bit) register having a first value (e.g., first logic level) indicative of the target memory cell 208 ₁ being deactivated, e.g., in response to a sensing by the sensing device 640 indicating that current flow between the data line 204 and the source 216 is inhibited. The register 644 might further have a second value (e.g., second logic level different than the first logic level) indicative of the target memory cell 208 ₁ being activated, e.g., in response to a sensing by the sensing device 640 indicating that current flow between the data line 204 and the source 216 is enabled. The page buffer 240 might further include a second register 646 that might be a multi-digit (e.g., multi-bit) register. In response to a sensing by the sensing device 640 indicating that current flow between the data line 204 and the source 216 is enabled, the page buffer 240 might be configured (e.g., in response to toggling the value of the first register 644 to its second value) to latch a representation 648 of a voltage level into the register 646, e.g., a representation of a voltage level being applied to the selected access line 202 ₁. In this manner, the register 646 might contain a representation of the threshold voltage of the target memory cell 208 ₁, e.g., a representation of the voltage level at which the state of the data line 204 changed. Oftentimes, a counter and a digital-to-analog converter (DAC), not shown, are used to generate the voltage levels applied during a read operation, where a count of the counter might indicate the voltage level output from the DAC. In such a system, the count would thus represent the voltage level being applied.

Using the example of FIG. 6, the intermediate read voltage might be applied to the selected access line 202 ₁. The data line 204 might be connected to the sensing device 640 upon activation of the transistor (e.g., n-type field effect transistor or nFET) 650, e.g., by applying a control signal BLclamp to control signal node 652 having a voltage level sufficient to activate the transistor 650. If the register 644 has its second logic level in response to the sensing of the state of the data line 204 by the sensing device 640, the memory cell 208 ₁ might be counted as being activated. The structure of FIG. 6 might be repeated for each memory cell of the group of memory cells for which the determination of expected data age is to be performed, such that a number of registers 644 having their second logic level could indicate the number of activated memory cells of that group of memory cells. Alternatively, the number of deactivated memory cells might be determined to indicate a number of activated memory cells by subtracting the number of deactivated memory cells from a total number of memory cells.

Various embodiments may add noise to a control signal while sensing the states of the target memory cells of a read operation while the intermediate read voltage is being applied. Noise might be added to the sensing of the states of the target memory cells to disturb the current paths between the sensing devices 640 and the source 216, for example. The noise might induce a read error, increasing a sigma of apparent threshold voltages of the target memory cells being read. Increasing the sigma of apparent threshold voltages may serve to improve the determination of expected data age. While noise might be added to the sensing of the target memory cells while applying the intermediate read voltage, embodiments may generally not add noise while applying any of the subsequent read voltages, e.g., read voltages 432 ₀-432 ₁₄ for a QLC memory, as such noise might result in an inaccurate determination of their individual data states.

In the example of FIG. 6, noise might be added to the control signal node 652, e.g., by applying a control signal BLclamp to have a nominal voltage level and an intentional waveform fluctuating (e.g., oscillating) around that nominal voltage level sufficient to activate the transistor 650. Noise might also be added by applying the intermediate read voltage to the selected access line to have a nominal voltage level and an intentional waveform fluctuating (e.g., oscillating) around that nominal voltage level. In a similar manner, noise might be added to the unselected access lines, the source 216, the select lines 214 and/or 215, or any other node of the array of memory cells that would affect the sensing of the target memory cell.

FIGS. 7A-7F are graphs showing example waveforms for use in accordance with embodiments. Various other waveforms might be used to add noise to the sensing operation. FIG. 7A might represent a pseudo-sinusoidal waveform 754A having a nominal voltage level 756 and an amplitude 758. FIG. 7B might represent a square waveform 754B having a nominal voltage level 756 and an amplitude 758. FIG. 7C might represent a sawtooth waveform 754C having a nominal voltage level 756 and an amplitude 758. FIG. 7D might represent a triangle waveform 754D having a nominal voltage level 756 and an amplitude 758. While the examples of FIGS. 7A-7D depict oscillating waveforms having a constant amplitude, the added noise might utilize amplitude modulation. FIG. 7E might represent an amplitude-modulated pseudo-sinusoidal waveform having a nominal voltage level 756 and an amplitude 758′, e.g., a maximum amplitude. Although not depicted, frequency modulation might also be used, and modulation might be added to waveforms other than a pseudo-sinusoidal waveform. Similarly, while the examples of FIGS. 7A-7E depict oscillating waveforms, the added noise need not be regular. FIG. 7F might represent a pseudo-random waveform having a nominal voltage level 756 and an amplitude 758′, e.g., a maximum amplitude. A voltage range of each of the waveforms of FIGS. 7A-7F might be twice their respective amplitude 758 or 758′. For noise added to the intermediate read voltage, the nominal voltage level 756 might be equal to the desired intermediate read voltage.

The noise added to the sensing of the memory cells selected for a read operation may serve to widen the distributions of threshold voltages as noted previously. Such widening may result, at least in part, from the different delays naturally experienced by different sensing chains (e.g., through differing characteristics of signal lines and discrete devices) for the different memory cells selected for the read operation. With reference to FIG. 6, a sensing chain might be a path between, and including, the source 216 and a sensing device 640. As the noise propagates through the array parasitics, memory cells having the same threshold voltage, but belonging to different sensing chains, may exhibit apparent differences in their sensed threshold voltages. The natural delays of the array of memory cells may define a suitable frequency of the waveform. For some embodiments, the waveform might have a frequency in the range of 100 KHz to 1 MHz (e.g., a period in the range of 10 μs to 1 μs). Alternatively, a suitable frequency, as well as a suitable amplitude, for the waveform might further be determined empirically, based on knowledge of the structure and materials of the memory cells as well as the architecture of the array of memory cells, or directly through experimentation.

FIG. 8 depicts a timing diagram for a method of operating a memory in accordance with an embodiment. For example, the timing diagram of FIG. 8 might represent a read operation of a memory. Trace 860 might represent the voltage level applied to an access line connected to a memory cell selected for the read operation, e.g., a target memory cell. The following discussion will be made with reference to at least FIG. 2A and will presume that the memory cell selected for the read operation is the memory cell 208 _(x) of the NAND string 206 ₀, such that trace 860 might represent the voltage level applied to access line 202 _(x). The access line 202 _(x) may be referred to as the selected access line as it contains the target memory cell, while remaining access lines 202 may be referred to as unselected access lines. The NAND string 206 ₀ may be referred to as the selected string of series-connected memory cells as it contains the target memory cell. Trace 862 might represent the voltage level applied to one or more of the unselected access lines 202, e.g., access lines 202 ₀-202 _(x−1) and 202 _(x+1)-202 _(N). Trace 864 might represent the voltage level applied to the select line 214 and the voltage level applied to the select line 215.

At time t0, a precharge phase might begin. The precharge phase of the read operation might bring the unselected access lines 202 to a voltage level sufficient to activate their respective connected memory cells regardless of their data states, e.g., a pass voltage. As shown in the example of FIG. 8, the voltage levels of all access lines 202 of the block of memory cells containing the target memory cell (e.g., one or more target memory cells) are initially brought up to a voltage level 868. The voltage level 868 may be sufficient to activate each memory cell connected to one of the access lines 202 regardless of their data state. As one example, voltage level 868 might be approximately 8V. Bringing all of the access lines 202 up together in this manner may facilitate improvements in speed to steady state of any access line 202 whose desired voltage level is the voltage level 868. The select line 214 and the select line 215 might be brought up to a voltage level 874 sufficient to activate their respective select gates.

At or around time t1, the selected access line 202 _(x) might be discharged to a voltage level 872. The voltage level 872 might represent a read voltage intended to distinguish between possible data states of the target memory cell. For example, if the target memory cell is activated while the voltage level 872 is applied to the access line 202 _(x), and thus to the control gate of the target memory cell, it may be deemed to have a data state corresponding to a range of threshold voltages lower than or equal to the voltage level 872. If the target memory cell is deactivated while the voltage level 872 is applied to the access line 202 _(x), it may be deemed to have a data state corresponding to a range of threshold voltages higher than the voltage level 872. A sensing operation might be performed while the voltage level 872 is being applied, as is well understood in the art. As one example, the voltage level 872 might correspond to the read voltage 430 ₀. Although the voltage level 872 is depicted as being higher than the voltage level 866, the voltage level 872 might be a negative voltage level for some embodiments.

While the voltage level 872 is being applied to the selected access line 202 _(x) at time t2, the voltage level 868 is being applied to the unselected access lines 202 ₀-202 _(x−1) and 202 _(x+1)-202 _(N). The voltage level 868 is sufficient to activate the memory cells connected to these unselected access lines regardless of their data state. In addition, while the voltage level 872 is being applied to the selected access line 202 _(x) at time t2, the voltage level 870 might be applied to the select line 214 and to the select line 215. The voltage level 870 might be sufficient to activate the select gates connected to these select lines. In this manner, current flow may be established through the NAND string 206 if the target memory cell is activated, thus permitting sensing of its data state. As one example, the voltage level 874 might be approximately 5V.

At time t3, the voltage level applied to the selected access line 202 _(x) might be increased to the voltage level 874 while voltage levels of the other traces 862 and 864 might be maintained. The voltage level 874 might represent a different read voltage intended to distinguish between different possible data states of the target memory cell. A sensing operation might be performed while the voltage level 874 is being applied, as is well understood in the art. As one example, the voltage level 874 might correspond to the read voltage 430 ₁.

At time t4, the voltage level applied to the selected access line 202 _(x) might be increased to the voltage level 876 while voltage levels of the other traces 862 and 864 might be maintained. The voltage level 876 might represent a different read voltage intended to distinguish between different possible data states of the target memory cell. A sensing operation might be performed while the voltage level 876 is being applied, as is well understood in the art. As one example, the voltage level 876 might correspond to the read voltage 430 ₂.

At time t5, the voltage level applied to the selected access line 202 _(x) might be increased to the voltage level 878 while voltage levels of the other traces 862 and 864 might be maintained. The voltage level 878 might represent a different read voltage intended to distinguish between different possible data states of the target memory cell. A sensing operation might be performed while the voltage level 878 is being applied, as is well understood in the art. As one example, the voltage level 878 might correspond to the read voltage 430 ₃.

At time t6, the voltage level applied to the selected access line 202 _(x) might be increased to the voltage level 880 while voltage levels of the other traces 862 and 864 might be maintained. The voltage level 880 might represent a different read voltage intended to distinguish between different possible data states of the target memory cell. A sensing operation might be performed while the voltage level 880 is being applied, as is well understood in the art. As one example, the voltage level 880 might correspond to the read voltage 4304.

At time t7, the voltage level applied to the selected access line 202 _(x) might be increased to the voltage level 882 while voltage levels of the other traces 862 and 864 might be maintained. The voltage level 882 might represent a different read voltage intended to distinguish between different possible data states of the target memory cell. A sensing operation might be performed while the voltage level 882 is being applied, as is well understood in the art. As one example, the voltage level 882 might correspond to the read voltage 4305.

At time t8, the voltage level applied to the selected access line 202 _(x) might be increased to the voltage level 884 while voltage levels of the other traces 862 and 864 might be maintained. The voltage level 884 might represent a different read voltage intended to distinguish between different possible data states of the target memory cell. A sensing operation might be performed while the voltage level 884 is being applied, as is well understood in the art. As one example, the voltage level 884 might correspond to the read voltage 4306.

While only seven read voltages are depicted in FIG. 8, other numbers of read voltages might be used. In general, Y read voltages might be used to distinguish between each of Y+1 possible data states. At time t9, all of the lines might be discharged to the voltage level 866, which might be a reference potential, e.g., ground or 0V. The period between time t2 and t9, for each read voltage of the read operation, might correspond to a sensing phase of the read operation when the data states of one or more target memory cells are sensed.

To determine the read voltages to be utilized during a read operation, an expected data age of the memory cells selected for the read operation might be determined, either prior to, or during, the read operation to sense the data states. FIG. 9 depicts a timing diagram for a method of operating a memory in accordance with an embodiment that addresses such a determination of expected data age.

At time t0, a precharge phase might begin, as described with reference to FIG. 8. At or around time t1, the selected access line 202 _(x) might be discharged to a voltage level 890. The voltage level 890 might represent the intermediate read voltage, e.g., intermediate read voltage 436, and may include noise, e.g., added (e.g., intentionally added) noise. For example, if the target memory cell is activated while the voltage level 890 is applied to the access line 202 _(x), and thus to the control gate of the target memory cell, it might be counted in the number of memory cells activated in response to the intermediate read voltage. If the target memory cell is deactivated while the voltage level 890 is applied to the access line 202 _(x), it might not be counted in the number of memory cells activated in response to the intermediate read voltage. A sensing operation might be performed while the voltage level 890 is being applied, as is well understood in the art. Noise might be added to the sensing operation, e.g., between times t1 a and t1 b, while the voltage level 890 is being applied. For some embodiments, noise might be added to a control signal for a control gate of a transistor between the sensing device and a source, e.g., between the sensing device and a data line. For some embodiments, the voltage level 890 might represent the nominal voltage level of a fluctuating waveform.

While the voltage level 890 is being applied to the selected access line 202 _(x) at time t1 a, the voltage level 868 might be applied to the unselected access lines 202 ₀-202 _(x−1) and 202 _(x+1)-202 _(N) as described with reference to FIG. 8. In addition, while the voltage level 890 is being applied to the selected access line 202 _(x) at time t2, the voltage level 870 might be applied to the select line 214 and to the select line 215 as described with reference to FIG. 8. A sensing operation might be performed while the voltage level 890 is being applied, as is well understood in the art, to determine whether the target memory cell 208 _(x) is activated in response to the voltage level 890. If the target memory cell 208 _(x) is activated, the register 644 might latch its second logic level, and if the target memory cell 208 _(x) is deactivated, the register 644 might retain its first logic level.

The number of memory cells activated in response to applying the voltage level 890 might be counted, e.g., a sum of the registers 644 having their second logic level (e.g., logic high level) might be performed. This detected number of memory cells, whether expressed as a quantity, fraction or percentage, might then be used to determine an expected data age of the group of memory cells as previously described. In response to a determination of the expected data age, a set of read voltages to be used in sensing the data states of the memory cells might then be determined. The process could end at time t1 b, with the traces 860, 862 and 864 being discharged to the voltage level 866, and the read operation for those memory cells could be subsequently performed such as described with reference to FIG. 8.

Alternatively, the process could continue directly to the read operation at time t1 b with the selected access line 202 _(x) being discharged to the voltage level 872′, e.g., corresponding to the read voltage 430 ₀ at the determined expected data age. The processing from time t2 and beyond might proceed as described with reference to FIG. 8 with the exception that each of the subsequent voltage levels 874′, 876′, 878′, etc., might represent their respective read voltages 432 at the determined data age. The register 644 might be reset prior to discharging the selected access line 202 _(x), e.g., to prepare the register for use in determining the data state of the target memory cell 208 _(x) in response to the applied read voltages.

FIG. 10 is a flowchart of a method of operating a memory in accordance with an embodiment. For example, the method of FIG. 10 might be a portion of a read operation, or might be performed prior to (e.g., immediately prior to) a read operation. At 1001, an intermediate read voltage might be selected. The intermediate read voltage might have a voltage level within an initial read window for a group of memory cells. For some embodiments, the intermediate read voltage might be predetermined, and a representation of the intermediate read voltage might be contained within the trim register 128, for example.

At 1003, the intermediate read voltage might be applied to an access line selected for a read operation. While the intermediate read voltage is applied to the selected access line, unselected access lines and select gates might be activated. At 1005, noise might be added to a sensing operation, e.g., to determine a number of memory cells of a plurality of memory cells connected to the selected access line that are activated in response to applying the intermediate read voltage to the selected access line. The noise might be added while applying the intermediate read voltage. For some embodiments, the intermediate read voltage is a nominal voltage level of a fluctuating waveform and the noise is added to the sensing operation by applying this fluctuating waveform to the selected access line. For some embodiment, noise might be added to a control signal applied to a control gate of a transistor between a sensing device and a source, e.g., a transistor between the sensing device and a data line (e.g., each data line connected to a memory cell of the plurality of memory cells).

At 1007, a value indicative of a number of activated memory cells of the plurality of memory cells connected to the selected access line might be determined, e.g., through the sensing of whether memory cells of the plurality of memory cells are activated or deactivated while applying the intermediate read voltage and while adding noise to the sensing operation. At 1009, the expected data age of the plurality of memory cells might be determined in response to the value indicative of the number of activated memory cells, whether the value indicating the number of activated memory cells is represented by a quantity, fraction, percentage or otherwise.

FIG. 11 is a flowchart of a method of operating a memory in accordance with another embodiment. For example, the method of FIG. 11 might be a portion of a read operation. At 1111, an intermediate read voltage might be applied to an access line selected for a read operation. While the intermediate read voltage is applied to the selected access line, unselected access lines and select gates might be activated. The intermediate read voltage might be selected, or predetermined, as discussed with reference to FIG. 10.

At 1113, noise might be added to a sensing operation, e.g., to determine a number of memory cells of a plurality of memory cells connected to the selected access line that are activated in response to applying the intermediate read voltage to the selected access line. The noise might be added while applying the intermediate read voltage. For some embodiments, the intermediate read voltage is a nominal voltage level of a fluctuating waveform and the noise is added to the sensing operation by applying this fluctuating waveform to the selected access line. For some embodiment, noise might be added to a control signal applied to a control gate of a transistor between a sensing device and a source, e.g., a transistor between the sensing device and a data line (e.g., each data line connected to a memory cell of the plurality of memory cells).

At 1115, a value indicative of a number of activated memory cells of the plurality of memory cells connected to the selected access line might be determined, e.g., through the sensing of whether memory cells of the plurality of memory cells are activated or deactivated while applying the intermediate read voltage and while adding noise to the sensing operation. At 1117, a plurality of read voltages for the read operation might be determined in response to the value indicative of the number of activated memory cells. For example, the expected data age of the plurality of memory cells might be determined in response to the determined value indicative of the number of activated memory cells, whether the value indicating the number of activated memory cells is represented by a quantity, fraction, percentage or otherwise, and the plurality of read voltages might be determined in response to the expected data age of the plurality of memory cells.

FIG. 12 is a flowchart of a method of operating a memory in accordance with a further embodiment. For example, the method of FIG. 12 might be a portion of a read operation. At 1221, an intermediate read voltage might be selected. The intermediate read voltage might have a voltage level within an initial read window for a group of memory cells. For some embodiments, the intermediate read voltage might be predetermined, and a representation of the intermediate read voltage might be contained within the trim register 128, for example.

At 1223, the intermediate read voltage might be applied to an access line selected for a read operation. While the intermediate read voltage is applied to the selected access line, unselected access lines and select gates might be activated. At 1225, noise might be added to a sensing operation, e.g., to determine a number of memory cells of a plurality of memory cells connected to the selected access line that are activated in response to applying the intermediate read voltage to the selected access line. The noise might be added while applying the intermediate read voltage. For some embodiments, the intermediate read voltage is a nominal voltage level of a fluctuating waveform and the noise is added to the sensing operation by applying this fluctuating waveform to the selected access line. For some embodiment, noise might be added to a control signal applied to a control gate of a transistor between a sensing device and a source, e.g., a transistor between the sensing device and a data line (e.g., each data line connected to a memory cell of the plurality of memory cells).

At 1227, a value indicative of a number of activated memory cells of a plurality of memory cells connected to the selected access line might be determined, e.g., through the sensing of whether memory cells of the plurality of memory cells are activated or deactivated while applying the intermediate read voltage and while adding noise to the sensing operation. At 1229, the expected data age of the plurality of memory cells might be determined in response to the value indicative of the number of activated memory cells, whether the value indicating the number of activated memory cells is represented by a quantity, fraction, percentage or otherwise.

At 1231, a plurality of read voltages for the read operation might be determined in response to the expected data age of the plurality of memory cells. At 1233, the plurality of read voltages might be applied to the selected access line, e.g., sequentially from a lowest read voltage of the plurality of read voltages to a highest read voltage of the plurality of read voltages. While the plurality of read voltages are applied to the selected access line, unselected access lines and select gates might be activated. At 1235, the data state of a memory cell (e.g., each memory cell) of the plurality of memory cells might be determined in response to applying the plurality of read voltages to the selected access line. For some embodiments, the plurality of memory cells might include each memory cell connected to the selected access line. For other embodiments, the plurality of memory cells might include a subset (e.g., proper subset) of the memory cells connected to the selected access line, e.g., every other memory cell (e.g., even memory cells or odd memory cells) connected to the selected access line.

CONCLUSION

Although specific embodiments have been illustrated and described herein, it will be appreciated by those of ordinary skill in the art that any arrangement that is calculated to achieve the same purpose may be substituted for the specific embodiments shown. Many adaptations of the embodiments will be apparent to those of ordinary skill in the art. Accordingly, this application is intended to cover any adaptations or variations of the embodiments. 

What is claimed is:
 1. A method of operating a memory, comprising: applying an intermediate read voltage to a selected access line for a read operation; adding noise to a sensing operation while applying the intermediate read voltage; determining a value indicative of a number of memory cells of a plurality of memory cells connected to the selected access line that are activated in response to applying the intermediate read voltage to the selected access line during the sensing operation; and determining an expected data age of the plurality of memory cells in response to the value indicative of the number of memory cells of the plurality of memory cells that are activated in response to applying the intermediate read voltage to the selected access line.
 2. The method of claim 1, wherein the intermediate read voltage is a nominal voltage level of a fluctuating waveform, and wherein adding noise to the sensing operation comprises applying the fluctuating waveform to the selected access line.
 3. The method of claim 1, wherein adding noise to the sensing operation comprises applying a fluctuating waveform to a control gate of a transistor connected between a sensing device of the sensing operation and a source connected to a particular memory cell of the plurality of memory cells.
 4. The method of claim 3, wherein adding noise to the sensing operation comprises applying the fluctuating waveform to a control gate of a transistor connected between the sensing device of the sensing operation and a data line connected to the particular memory cell of the plurality of memory cells.
 5. The method of claim 4, wherein adding noise to the sensing operation comprises, for each memory cell of the plurality of memory cells, applying the fluctuating waveform to a control gate of a transistor connected between a respective sensing device of the sensing operation and a data line connected to that memory cell of the plurality of memory cells.
 6. The method of claim 1, further comprising: selecting the intermediate read voltage to have a voltage level higher than a lowest read voltage for the read operation at a particular data age and lower than a highest read voltage for the read operation at the particular data age.
 7. The method of claim 1, wherein determining the value indicative of the number of memory cells of the plurality of memory cells that are activated in response to applying the intermediate read voltage to the selected access line comprises determining a second value indicative of a number of memory cells of the plurality of memory cells that are deactivated in response to applying the intermediate read voltage to the selected access line, and subtracting the second value from a number of memory cells in the plurality of memory cells.
 8. The method of claim 1, wherein determining the value indicative of the number of memory cells of the plurality of memory cells that are activated in response to applying the intermediate read voltage to the selected access line comprises determining a value represented in a manner selected from a group consisting of a quantity of memory cells of the plurality of memory cells, a fraction of memory cells of the plurality of memory cells, and a percentage of memory cells of the plurality of memory cells.
 9. The method of claim 1, wherein determining the expected data age of the plurality of memory cells in response to the value indicative of the number of memory cells of the plurality of memory cells that are activated in response to applying the intermediate read voltage to the selected access line comprises using a lookup table.
 10. The method of claim 9, wherein using the lookup table comprises interpolating the expected data age from a first value of the expected data age at a first value indicative of the number of memory cells of the plurality of memory cells that are activated, and from a second value of the expected data age at a second value indicative of the number of memory cells of the plurality of memory cells that are activated.
 11. The method of claim 9, wherein using the lookup table comprises determining the expected data age using a table entry that is closest to the value indicative of the number of memory cells of the plurality of memory cells that are activated in response to applying the intermediate read voltage to the selected access line.
 12. The method of claim 1, wherein determining the expected data age comprises determining the expected data age represented as a time decade, and wherein X time decades equals 10^(X) seconds, with X having a value greater than or equal to zero.
 13. The method of claim 1, wherein adding noise to the sensing operation comprises applying a fluctuating waveform having a frequency in a range of 100 KHz and 1 MHz.
 14. A method of operating a memory, comprising: applying an intermediate read voltage to a selected access line for a read operation; adding noise to a sensing operation while applying the intermediate read voltage; determining a value indicative of a number of memory cells of a plurality of memory cells connected to the selected access line that are activated in response to applying the intermediate read voltage to the selected access line during the sensing operation; determining an expected data age of the plurality of memory cells in response to the value indicative of the number of memory cells of the plurality of memory cells that are activated in response to applying the intermediate read voltage to the selected access line; determining a plurality of read voltages for the read operation in response to the expected data age of the plurality of memory cells; applying the plurality of read voltages to the selected access line; and determining a data state of a particular memory cell of the plurality of memory cells in response to applying the plurality of read voltages to the selected access line.
 15. The method of claim 14, wherein adding noise to the sensing operation comprises, for each memory cell of the plurality of memory cells, disturbing a current path between a respective sensing device connected to that memory cell and a source connected to that memory cell.
 16. The method of claim 15, wherein disturbing the current path between the respective sensing device connected to a particular memory cell of the plurality of memory cells and the source comprises applying a fluctuating waveform to the selected access line, and wherein a nominal voltage level of the fluctuating waveform is the intermediate read voltage.
 17. The method of claim 15, wherein disturbing the current path between the respective sensing device connected to a particular memory cell of the plurality of memory cells and the source comprises applying a fluctuating waveform to a control gate of a transistor connected between a data line connected to the particular memory cell and the respective sensing device connected to the particular memory cell through the data line.
 18. The method of claim 14, wherein determining the value indicative of the number of memory cells of the plurality of memory cells that are activated in response to applying the intermediate read voltage to the selected access line comprises counting a number of registers of a page buffer connected to the plurality of memory cells that indicate detection of an activated memory cell.
 19. The method of claim 14, further comprising: if the particular memory cell, in response to applying the plurality of read voltages to the selected access line in an order of increasing voltage levels, activates for a first time when applying an Nth read voltage of the plurality of read voltages, determining the particular memory cell to have an Nth data state of a plurality of data states arranged in an order of increasing threshold voltage ranges.
 20. The method of claim 19, further comprising using error correction to change the determined data state of the particular memory cell.
 21. The method of claim 20, wherein using error correction to change the determined data state of the particular memory cell comprises changing the determined data state of the particular memory cell to a next lower data state of the plurality of data states arranged in the order of increasing threshold voltage ranges or to a next higher data state of the plurality of data states arranged in the order of increasing threshold voltage ranges.
 22. The method of claim 19, further comprising: if the particular memory cell, in response to applying the plurality of read voltages to the selected access line in the order of increasing voltage levels, does not activate in response to any read voltage of the plurality of read voltages, determining the particular memory cell to have a highest data state of the plurality of data states arranged in the order of increasing threshold voltage ranges.
 23. The method of claim 14, wherein applying the plurality of read voltages to the selected access line comprises applying the plurality of read voltages to the selected access line in an order of increasing voltage levels.
 24. The method of claim 23, wherein applying the intermediate read voltage to the selected access line comprises applying a voltage level to the selected access line that is higher than a first read voltage of the plurality of read voltages in the order of increasing voltage levels, and that is lower than a last read voltage of the plurality of read voltages in the order of increasing voltage levels.
 25. The method of claim 14, wherein determining the value indicative of the number of memory cells of the plurality of memory cells connected to the selected access line that are activated in response to applying the intermediate read voltage to the selected access line comprises a plurality of memory cells storing a pseudo-random distribution of data states of a plurality of data states. 